1 m e m o r y all data sheets are subject to change without notice (858) 503-3300 - fax: (858) 503-3301 - www.maxwell.com nuclear event detector hsn-2000 ?2005 maxwell technologies all rights reserved. 01.07.05 rev 3 f eatures : ? detects ionizing radiation pulses tested/certified detection threshold level adjustable circumvention period 100% testable with built-in test detection threshold adjustability single +5v operation designed-in radiation hardness compliant to mil-prf-38534 class h 1 flat pack (f) or dip (l) packages r adiation h ardness c haracteristics dose rate (operate-through): 1 x 10 12 rad(si)/sec total dose: 1 x 10 6 rad(si) neutron fluence: 5 x 10 13 n/cm 2 approximate detection range: 2 x 10 5 - 2 x 10 7 rad(si)/sec maxwell technologies specified, controlled, and tested d escription : maxwell technologies? hsn-2000 radiation-hardened hybrid nuclear event detector (ned) senses ionizing radiation pulses generated by a nuclear event, such as the detonation of a nuclear weapon, and rapidly switches its output from the normal high state to a low state with a propagation delay time of less than 20 ns. the active low nuclear event detection signal (ned ) is used to initiate a wide variety of circumvention functions, thus prevent- ing upset and burnout of electronic components. the ned output is also used to initiate both hardware and software recovery. this high-speed, 14-pin hybrid detector is used in electronic systems as a general-purpose circumvention device to protect memory, stop data processing, and drive power supply switches as well as signal clamps. the hsn-2000 is designed to operate through three critical envi- ronments: ionizing dose rate [10 12 rad(si)/s], gamma total dose [10 6 rad(si)], and neutron fluence [5 x 10 13 n/cm 2 ]. in addition, the device is designed to function throughout the transient neutron pulse. the hybrid?s discrete design ensures a controlled response in these radiation environments as well as immunity to latchup. the detection level and functionality of a sample of each hsn- 2000 production lot are tested in an ionizing dose rate environ- ment. a certificate is provided reporting the test results for the production lot. the detection threshold of the hsn-2000 is adjustable within the range of 2 x 10 5 rad(si)/s to 2 x 10 7 rad(si)/s. this detection level can be preset by maxwell or adjusted by the user. less than a 30% variation in detection threshold can be expected over the entire operating temperature range. 1. manufactured for maxwell technologies by teledyne microelectronic technologies to mil-prf-38534, class h, no rha logic diagram detector (pin diode) amplifier pulse timer led logic latch 12 4 5 7 6 8 9 14 1 2 13 11 v h v l threshold adjust v b bit gnd crc flag reset flag reset nef ned 10 k ? 10 k ?
m e m o r y 2 all data sheets are subject to change without notice ?2005 maxwell technologies all rights reserved. nuclear event detector hsn-2000 01.07.05 rev 3 t able 1. p in d escription p in n umber p in f unction 1 load voltage, v l 2 nuclear event detector, ned 3 no connection 4 external capacitor 5 external capacitor 6 built in test, bit 7 package ground and case 8 pin diode bias, v b 9 threshold adjust 10 no connection 11 no connection 12 no connection 13 no connection 14 hardened supply voltage, v h t able 2. e lectrical c haracteristics p arameter s ymbol c onditions -55 c < t a < 125 c m in m ax u nit g roup a s ubgroup hardened supply voltage v h 4.5 5.5 v 1,2,3 hardened supply current - standby 1 - operational 2 i h v h = 5.5v -- -- -- 30 120 ma 1,2,3 load voltage v l -- 20 v 1,2,3 load current - standby 1 - operational 2 i l v l = 20v -- -- 100 2.25 a ma 1,2,3 pin diode bias voltage - standby 1 v b 4.5 20 v 1,2,3 pin diode bias current - standby 1 i b -- 100 a 1,2,3 built-in-test (bit) 3,4 v ih i ih v il i il t pw v ih = 4.0v v il = 0.5v pin 9 open, v ih = 4.0v 4.0 -- -- -- 10 5.5 25 0.5 10 -- v ma v a s 7,8 1,2,3 7,8 1,2,3 9,10,11 ned v oh v ol v l = 20v, i oh = -100 a i ol = 10 ma i ol = 100 ma 18.5 -- -- -- 0.6 1.0 v 1,2,3 1,2,3 radiation propagation delay time 5 t d -- 20 ns
m e m o r y 3 all data sheets are subject to change without notice ?2005 maxwell technologies all rights reserved. nuclear event detector hsn-2000 01.07.05 rev 3 m echanical d imensions note: all dimensions in inches. 1. standby mode is the normal state of the device, defined as having the ned output (pin 2) in the ?high? state. 2. operational mode is in effect during the timeout period of the ned signal, characterized by having the ned output in the ?low ? state, causing the greatest current draw of the device. 3. bit electrical characteristics are not guaranteed over the radiation range. 4. bit may not meet specification when only a resistor is used to adjust the detection level. to use bit in this situation, it i s advised that a series resistor/capacitor combination is used. 5. guaranteed but not tested over temperature. time delay, t d , is measured at 50% points from the rising edge of the radiation pulse to the falling edge of the ned output at approximately 10 times the detection level. 0.600 0.015 0.003 0.100 typ 0.500 min 0.495 0.795 0.145 max 0.070 0.002 0.010 0.002 14 13 12 11 10 9 8 1234567 14 13 12 11 10 9 8 1234567 0.795 0.600 0.100 typ 0.495 0.300 0.145 max 0.200 0.016 0.020 dia top view flatpack hybrid package hsn-500f dip hybrid package hsn-500l all tolerances are 0.005 unless specified table 2. notes
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